seki lab. logo

Publication
出版物

2004

18
M. Todo, K. Okamoto, S. Seki, and S. Tagawa
Formation of Benzene Trimer Radical Cation in γ-Irradiated Low Temperature 2-Methylpentane Matrices
Chem. Phys. Lett., 399(4-6), 378-383(2004). DOI: 10.1016/j.cplett.2004.10.044

17
Y. Terashima, S. Seki, M. Tashiro, Y. Honda, and S. Tagawa
Formation of Defect Structures in Au-Polysilane Interfaces Probed by Low Energy Positron Beams
Solid State Commun., 132(9), 641-645(2004). DOI: 10.1016/j.ssc.2004.08.021

16
S. Seki, S. Tsukuda, K. Maeda, Y. Matsui, A. Saeki, and S. Tagawa
Inhomogeneous Distribution of Crosslinks in Ion Tracks in Polystyrene and Polysilanes
Phys. Rev. B, 70(14), 144203/1-144203/8(2004). DOI: 10.1103/PhysRevB.70.144203

15
Y. Koizumi, S. Seki, A. Acharya, A. Saeki, and S. Tagawa
Delocalization of Positive and Negative Charge Carriers on Oligo- and Poly-Fluorenes Studied by Low-Temperature Matrix Isolation Technique
Chem. Lett., 33(10), 1290-1291(2004). DOI: 10.1246/cl.2004.1290

14
S. Tsukuda, S. Seki, A. Saeki, T. Kozawa, S. Tagawa, M. Sugimoto, A. Idesaki, and S. Tanaka
Precise Control of Nanowire Formation Based on Polysilane for Photoelectronic Device Application
Jpn. J. Appl. Phys., 43(6B), 3810-3814(2004). DOI: 10.1143/JJAP.43.3810

13
Y. Matsui, S. Seki, S. Tagawa, S. Kishimura, and M. Sasago
157-nm-Induced Resist Outgassing Studied by Film Thickness Loss and In-Situ Quadrupole Mass Spectrometry
J. Photopolym. Sci. Technol., 17(4), 671-673(2004). DOI: 10.2494/photopolymer.17.671

12
S. Seki, Y. Koizumi, T. Kawaguchi, H. Habara, and S. Tagawa
Dynamics of Positive Charge Carriers on Si Chains of Polysilanes
J. Am. Chem. Soc., 126(11), 3521-3528(2004). DOI: 10.1021/ja039840e

11
S. Tsukuda, S. Seki, S. Tagawa, M. Sugimoto, A. Idesaki, S. Tanaka, and A. Oshima
Fabrication of Nanowires Using High-Energy Ion Beams
J. Phys. Chem. B, 108(11), 3407-3409(2004). DOI: 10.1021/jp037638s