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Instruments
研究装置

Surface morphology observation

Atomic Force Microscope: AFM

SPA 400

Atomic Force Microscope: AFM

STA-56

Polarized Optical Microscope: POM

nikon MODEL ECLIPSE E-600FN

Field-Effect Scanning Electron Microscope: FE-SEM)

Scanning Tunneling Microscope: STM)

Surface Profiler, Film Thickness Measurement

Dektak XT-E

Microwave and optical measurement

Flash Photolysis Time Resolved Microwave Conductivity: FP-TRMC, Transient Absorption Sepectroscopy: TAS

homemade

Electron Spin Resonance: ESR, with time-resolved measurment

JES-FA200

Field Induced Time Resolved Microwave Conductivity: FI-TRMC

homemade

Laser Raman Spectrometer

NRS-4100

Polarized Raman Spectrometer

homemade

Picosecond Transient Absorption Spectroscopy System

homemade

Fluorescence Lifetime Spectroscopy System

homemade

Fabrication and evaluation of organic electronic devices

Glovebox with spin-coater, heater, weighter

Thermal evaporator and RF sputter, (connected to glove box

Probe station

Semiconductor Analyzer

KEITHLEY 4200-SCS/F

Thermal evaporator and RF sputter

VX-2OH

UV/Ozone, spin-coater, vaccum oven

Photo Lithography

Maskless Photolithography System

DDB-701

SQUID

Laser microfabrication workstation

General measurement/synthesis

Cyclic Voltammetry: CV

ALS 760E Electrochemical Analyzer / CS-3A Cell Stand

Differential Scanning Calorimeter: DSC

DSC8000

Simultaneous Thermogravimetric and Differential Thermal Analyzer

DTG-60

Evaporator

N-1110V, N-1000V

Nuclear Magnetic Resonance: NMR

Fourier Tranform Infrared Spectrometer: FT-IR

FT/IR-6300

UV-Vis-NIR Spectrophotometer

V-770

Fluorescence Spectrometer

RF-6000

X-ray Diffractometer

MiniFlex 600

High performance liquid chromatography: HPLC (Chiral resolution)

High performance liquid chromatography: HPLC

LaboACE LC-5060

MALDI-TOF instrument

Microflex